Invention Grant
- Patent Title: Magnetism metric controller
- Patent Title (中): 磁力公制控制器
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Application No.: US10991370Application Date: 2004-11-19
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Publication No.: US07208942B2Publication Date: 2007-04-24
- Inventor: Wen-Chin Lee , Shang-Hao Chen
- Applicant: Wen-Chin Lee , Shang-Hao Chen
- Applicant Address: TW Taipei TW Taichung Hsien
- Assignee: Gimbal Technology Co., Ltd.,Sunrex Technology Corp.
- Current Assignee: Gimbal Technology Co., Ltd.,Sunrex Technology Corp.
- Current Assignee Address: TW Taipei TW Taichung Hsien
- Agent Leong C. Lei
- Main IPC: G01B7/30
- IPC: G01B7/30 ; G09G5/08
Abstract:
A precise, consistent, reliable, and high resolution magnetism metric controller applied in electronic and information devices is comprised of a scrolling wheel mechanism to drive by rotation a permanent magnet to retrieve signals of changed magnetic field due to displacement of magnetic poles of the permanent magnet.
Public/Granted literature
- US20060108999A1 Magnetism metric controller Public/Granted day:2006-05-25
Information query
