发明授权
- 专利标题: Apparatus and method of detecting defects on optical recording media
- 专利标题(中): 检测光记录媒体缺陷的装置及方法
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申请号: US10336017申请日: 2003-01-03
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公开(公告)号: US07212479B2公开(公告)日: 2007-05-01
- 发明人: Jyh-Shin Pan , Chih-Yuan Chen
- 申请人: Jyh-Shin Pan , Chih-Yuan Chen
- 申请人地址: TW Hsin-Chu City
- 专利权人: Mediatek Inc.
- 当前专利权人: Mediatek Inc.
- 当前专利权人地址: TW Hsin-Chu City
- 代理商 Winston Hsu
- 优先权: TW91120597A 20020910
- 主分类号: G11B7/00
- IPC分类号: G11B7/00 ; G11B5/09
摘要:
An apparatus of detecting defects on an optical recording medium includes a defect signal generating circuit for generating a corresponding defect signal according to a surface defect of the optical recording medium, a first synchronous signal generator for generating a first synchronous signal, a defect signal locating circuit, a delay signal generating circuit, and an OR gate. The defect signal includes at least one pulse, whose width corresponds to the physical width of a surface defect. The delay signal generating circuit generates a delay signal corresponding to each pulse when the spacing between two adjacent pulses is smaller than a preset value. An OR operation is performed to the delay signal and the defect signal to obtain a defect extension signal. The first synchronous signal and a second synchronous signal for separating data recording sectors of the optical recording medium are employed to detect widths and addresses of surface defects.
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