发明授权
US07214624B2 Resist pattern forming method, magnetic recording medium manufacturing method and magnetic head manufacturing method 失效
抗蚀剂图案形成方法,磁记录介质制造方法和磁头制造方法

  • 专利标题: Resist pattern forming method, magnetic recording medium manufacturing method and magnetic head manufacturing method
  • 专利标题(中): 抗蚀剂图案形成方法,磁记录介质制造方法和磁头制造方法
  • 申请号: US10982824
    申请日: 2004-11-08
  • 公开(公告)号: US07214624B2
    公开(公告)日: 2007-05-08
  • 发明人: Minoru FujitaMitsuru Takai
  • 申请人: Minoru FujitaMitsuru Takai
  • 申请人地址: JP Tokyo
  • 专利权人: TDK Corporation
  • 当前专利权人: TDK Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Kenyon & Kenyon LLP
  • 优先权: JPP2003-384694 20031114
  • 主分类号: H01L21/302
  • IPC分类号: H01L21/302
Resist pattern forming method, magnetic recording medium manufacturing method and magnetic head manufacturing method
摘要:
A mold having a pattern of a concavo-convex surface including protrusion and recess is prepared and the pattern is transferred to a resist layer formed on a substrate by an imprinting method. The side surface of a protrusion of the transferred resist pattern is then etched so that the protrusion has a width narrower than a width of the corresponding recess formed to the mold. This resist pattern forming method is preferably applicable to a magnetic recording medium manufacturing method and a magnetic head manufacturing method.
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