发明授权
- 专利标题: Equipment inspection support system, equipment inspection support method, and program therefor
- 专利标题(中): 设备检查支持系统,设备检查支持方法及程序
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申请号: US11336940申请日: 2006-01-23
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公开(公告)号: US07216060B1公开(公告)日: 2007-05-08
- 发明人: Ai Yano , Tatsuro Matsumoto , Kazuo Sasaki , Satoru Watanabe , Masayuki Fukui , Eiichi Takahashi
- 申请人: Ai Yano , Tatsuro Matsumoto , Kazuo Sasaki , Satoru Watanabe , Masayuki Fukui , Eiichi Takahashi
- 申请人地址: JP Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JP Kawasaki
- 代理机构: Staas & Halsey LLP
- 优先权: JP2005-314340 20051028
- 主分类号: G06F11/30
- IPC分类号: G06F11/30 ; G21C17/00
摘要:
An equipment inspection support system, equipment inspection support method, and program including maintenance and inspection management unit selecting and transmitting to a terminal device inspection item contents stored in contents storage unit, receiving inspection result data transmitted from terminal device; timing determination unit determining status information acquisition timing by status information acquisition device based on inspection item contents transmitted to terminal device by maintenance and inspection management unit and the inspection result data transmitted from the terminal device; status information acquisition unit collecting status information acquired by the status information acquisition device according to status information acquisition timing determined by timing determination unit; result data control unit creating result data correspondence table associating the inspection result data received by maintenance and inspection management unit and status information collected by the status information acquisition unit; and inspection result storage unit storing inspection result data, status information and result data correspondence table.
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