发明授权
- 专利标题: Opthalmic measuring apparatus
- 专利标题(中): 光学测量仪器
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申请号: US10683126申请日: 2003-10-14
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公开(公告)号: US07222962B2公开(公告)日: 2007-05-29
- 发明人: Yoko Hirohara , Hiroaki Hashimoto
- 申请人: Yoko Hirohara , Hiroaki Hashimoto
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Topcon
- 当前专利权人: Kabushiki Kaisha Topcon
- 当前专利权人地址: JP Tokyo
- 代理机构: Foley & Lardner LLP
- 优先权: JP2002-302435 20021017
- 主分类号: A61B3/10
- IPC分类号: A61B3/10
摘要:
An optical characteristic of an eye is obtained which can not be measured through a uniform adjustment because of a large difference in the distribution of a refractive index, or the like. An arithmetic part first selects an interlock mode, and performs an alignment adjustment. Next, the arithmetic part measures refraction, and interlocks and moves a first illumination optical system and a first light receiving optical system on the basis of the refraction. The arithmetic part obtains a density distribution of point images obtained from a first light receiving part, and judges whether a measurement can be made for each area on the basis of the density. The arithmetic part makes an adjustment so that an unmeasurable area becomes measurable, and creates a composite point image from plural signals obtained in a process of the adjustment. Further, the arithmetic part uses the composite point image to perform a Zernike analysis, obtains the optical characteristic and outputs it on a display part or the like.
公开/授权文献
- US20040130678A1 Opthalmic measuring apparatus 公开/授权日:2004-07-08
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