- 专利标题: Method of manufacturing a semiconductor device
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申请号: US10984391申请日: 2004-11-09
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公开(公告)号: US07229864B2公开(公告)日: 2007-06-12
- 发明人: Koichiro Tanaka
- 申请人: Koichiro Tanaka
- 申请人地址: JP
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP
- 代理机构: Cook, Alex, McFarron, Manzo, Cummings & Mehler, Ltd.
- 优先权: JP2000-079159 20000321
- 主分类号: H01L21/84
- IPC分类号: H01L21/84
摘要:
By using lasers having different wavelengths in laser annealing of an amorphous semiconductor film, the amorphous semiconductor film can be crystallized and the crystallinity of the crystallized film is improved. A laser 126 to 370 nm in wavelength is used first to subject an amorphous semiconductor film to laser annealing, thereby obtaining a crystalline semiconductor film. In desirable laser annealing, a subject surface is irradiated with a laser beam processed by an optical system into a linear laser beam that is linear in section on the subject surface. Next, a laser 370 to 650 nm in wavelength is used to irradiate the above crystalline semiconductor film by again processing the laser beam into a linear beam through an optical system. A crystalline semiconductor film thus obtained has an excellent crystallinity. If this crystalline semiconductor film is used to form an active layer of a TFT, an electric characteristic of the TFT can be improved.
公开/授权文献
- US20050095761A1 Method of manufacturing a semiconductor device 公开/授权日:2005-05-05
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