发明授权
- 专利标题: Electronic circuit device with reduced breaking and cracking
- 专利标题(中): 电子电路装置具有减少破裂和破裂的作用
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申请号: US10628443申请日: 2003-07-29
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公开(公告)号: US07230320B2公开(公告)日: 2007-06-12
- 发明人: Hiroaki Doi , Noriyoshi Urushiwara , Akira Matsushita
- 申请人: Hiroaki Doi , Noriyoshi Urushiwara , Akira Matsushita
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Crowell & Moring LLP
- 优先权: JP2003-039084 20030218
- 主分类号: H01L23/498
- IPC分类号: H01L23/498 ; H01L25/16 ; H01L23/48 ; H01L23/495
摘要:
In an electronic circuit device including a substrate including a front surface on which an electronic circuit element is mounted and a reverse surface opposite to the front surface in a thickness direction of the substrate, an electrically conductive terminal member electrically connected to the electronic circuit element, a lead frame extending perpendicular to the thickness direction to face the reverse surface in the thickness direction, and a sealing resin covering at least partially the electronic circuit element, substrate and lead frame while at least a part of the electrically conductive terminal member is prevented from being covered by the sealing resin, the substrate extends to project outward from an end of the lead frame in a transverse direction perpendicular to the thickness direction while the end of the lead frame is covered by the sealing resin.
公开/授权文献
- US20040159919A1 Electronic circuit device 公开/授权日:2004-08-19
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