发明授权
- 专利标题: Pattern matching using multiple techniques
- 专利标题(中): 使用多种技术的模式匹配
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申请号: US10100418申请日: 2002-03-18
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公开(公告)号: US07233699B2公开(公告)日: 2007-06-19
- 发明人: Lothar Wenzel , Nicolas Vazquez , Kevin L. Schultz , Dinesh Nair
- 申请人: Lothar Wenzel , Nicolas Vazquez , Kevin L. Schultz , Dinesh Nair
- 申请人地址: US TX Austin
- 专利权人: National Instruments Corporation
- 当前专利权人: National Instruments Corporation
- 当前专利权人地址: US TX Austin
- 代理机构: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- 代理商 Jeffrey C. Hood; Mark S. Williams
- 主分类号: G06K9/62
- IPC分类号: G06K9/62
摘要:
A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. An image is received by a computer from an image source, e.g., a camera. First pattern matching is performed on the image using a first pattern matching technique to determine a plurality of candidate areas. Second pattern matching is performed on each of the candidate areas using a second different pattern matching technique to generate final pattern match results. An output is generated indicating the final pattern match results. The second pattern matching may determine a second plurality of candidate areas which may be analyzed to determine the final pattern match results. The first pattern matching may use a plurality of pattern matching techniques, the results of which may be used to select a best technique from the plurality of techniques to use for the second pattern match.
公开/授权文献
- US20030174891A1 Pattern Matching using multiple techniques 公开/授权日:2003-09-18
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