发明授权
- 专利标题: Fault isolation in a programmable logic device
- 专利标题(中): 可编程逻辑器件中的故障隔离
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申请号: US10959389申请日: 2004-10-06
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公开(公告)号: US07234120B1公开(公告)日: 2007-06-19
- 发明人: Donald Audley Staab , Ian L. McEwen , Reto Stamm , Phoumra Tan
- 申请人: Donald Audley Staab , Ian L. McEwen , Reto Stamm , Phoumra Tan
- 申请人地址: US CA San Jose
- 专利权人: Xilinx, Inc.
- 当前专利权人: Xilinx, Inc.
- 当前专利权人地址: US CA San Jose
- 代理商 LeRoy D. Maunu
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Identification of a faulty net in a design implemented on a programmable logic device (PLD). In one approach, configuration data is generated to implement a duplicate circuit of a failing sub-circuit in the design. The PLD is configured with the configuration data that implements the failing sub-circuit and the duplicate circuit, and at least one set of input signals is applied to the sub-circuit and the duplicate circuit. A signal from each net in the sub-circuit is compared on the PLD to a corresponding net in the duplicate circuit. In response to the signal from the net in the sub-circuit being unequal to a signal from the corresponding net in the duplicate circuit, the net in the sub-circuit is identified as faulty.
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