发明授权
US07235347B2 Low pH development solutions for chemically amplified photoresists
有权
用于化学放大光致抗蚀剂的低pH开发解决方案
- 专利标题: Low pH development solutions for chemically amplified photoresists
- 专利标题(中): 用于化学放大光致抗蚀剂的低pH开发解决方案
-
申请号: US11133077申请日: 2005-05-19
-
公开(公告)号: US07235347B2公开(公告)日: 2007-06-26
- 发明人: Mark Wagner , Merrick Miles , Chris Harbinson
- 申请人: Mark Wagner , Merrick Miles , Chris Harbinson
- 申请人地址: US NC Raleigh
- 专利权人: Micell Technologies, Inc.
- 当前专利权人: Micell Technologies, Inc.
- 当前专利权人地址: US NC Raleigh
- 代理机构: Myers Bigel Sibley & Sajovec, P.A.
- 主分类号: G03F7/30
- IPC分类号: G03F7/30
摘要:
A method for carrying out positive tone lithography with a carbon dioxide development system is carried out by: (a) providing a substrate, the substrate having a polymer resist layer formed thereon, (b) exposing at least one portion of the polymer resist layer to radiant energy causing a chemical shift to take place in the exposed portion and thereby form at least one light field region in the polymer resist layer while concurrently maintaining at least one portion of the polymer layer unexposed to the radiant energy to thereby form at least one dark field region in the polymer resist layer; (c) optionally baking the polymer resist layer; (d) contacting the polymer resist layer to a carbon dioxide solvent system, the solvent system comprising a polar group, under conditions in which the at least one light field region is preferentially removed from the substrate by the carbon dioxide solvent system as compared to the at least one dark field region; wherein the carbon dioxide solvent system comprises a first phase and a second phase, the first phase comprising carbon dioxide and the second phase comprising a polar fluid, with the at least one light field region being preferentially soluble in the polar fluid as compared to the at least one dark field region.
公开/授权文献
信息查询
IPC分类: