Invention Grant
US07236401B2 Nonvolatile semiconductor memory device and write/verify method thereof
失效
非易失性半导体存储器件及其写/验证方法
- Patent Title: Nonvolatile semiconductor memory device and write/verify method thereof
- Patent Title (中): 非易失性半导体存储器件及其写/验证方法
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Application No.: US11242897Application Date: 2005-10-05
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Publication No.: US07236401B2Publication Date: 2007-06-26
- Inventor: Yasushi Kameda
- Applicant: Yasushi Kameda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- Priority: JP2004-293870 20041006
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/06

Abstract:
A nonvolatile semiconductor memory device includes write/verify circuits, a switching elements which divides the bit lines into plural portions, and a control circuit. The control circuit is configured to control the write/verify circuits and switching elements. The control circuit performs a control operation to perform the write and verify operations with the switching elements set in an OFF state when a memory cell of an address to be written lies on the write/verify circuit side in the memory cell array, write and save data into a memory cell lying on the write/verify circuit side with the switching elements set in the OFF state when the memory cell lies farther apart from the write/verify circuit than the switching elements, and then turn ON the switching elements while the write/verify circuit is not being operated and write the saved data into a memory cell of an address to be written.
Public/Granted literature
- US20060126386A1 Nonvolatile semiconductor memory device and write/verify method thereof Public/Granted day:2006-06-15
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