Invention Grant
US07237230B2 System and method for generating data sets for testing embedded systems
有权
用于生成测试嵌入式系统的数据集的系统和方法
- Patent Title: System and method for generating data sets for testing embedded systems
- Patent Title (中): 用于生成测试嵌入式系统的数据集的系统和方法
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Application No.: US10105069Application Date: 2002-03-22
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Publication No.: US07237230B2Publication Date: 2007-06-26
- Inventor: Mark Underseth , Kirk Fertitta , Robert Howell
- Applicant: Mark Underseth , Kirk Fertitta , Robert Howell
- Applicant Address: US CA Cardiff
- Assignee: S2 Technologies, Inc.
- Current Assignee: S2 Technologies, Inc.
- Current Assignee Address: US CA Cardiff
- Agency: Knobbe Martens Olson & Bear, LLP
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A system and method for providing seamless communication with threads executing on an embedded computer. Using a DAT system, a programmer can test the communication interfaces of a thread via either a scripting program, any COM-compliant program, or a graphical test utility. The DAT system automatically formats a block of data that is transmitted between the embedded computer and a host computer and accounts for machine specific enumeration sizes, machine specific pointer sizes, machine specific structure alignment boundaries, machine specific integer sizes, and machine specific byte ordering.
Public/Granted literature
- US20020198675A1 System and method for generating data sets for testing embedded systems Public/Granted day:2002-12-26
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