发明授权
- 专利标题: Prospective abnormal shadow detecting system
- 专利标题(中): 前瞻性异常阴影检测系统
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申请号: US10166744申请日: 2002-06-12
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公开(公告)号: US07242795B2公开(公告)日: 2007-07-10
- 发明人: Hideya Takeo , Takashi Imamura
- 申请人: Hideya Takeo , Takashi Imamura
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2001-178151 20010613
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
Prospective micro calcification points in a radiation image of an object are extracted on the basis of image data representing the radiation image and clustered into cluster areas. A plurality of areas are set in the radiation image, and fluctuation in size and/or fluctuation in density of the prospective micro calcification points in each of the areas is obtained. Detected areas are extracted from the plurality of areas on the basis of the fluctuation in size and/or the fluctuation in density of the prospective micro calcification points in each of the areas, and each interconnected area where a predetermined number of or more extracted detected areas are continuous is set as a cluster area.
公开/授权文献
- US20020196967A1 Prospective abnormal shadow detecting system 公开/授权日:2002-12-26
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