发明授权
- 专利标题: Micro-tensile testing system
- 专利标题(中): 微拉伸试验系统
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申请号: US11229111申请日: 2005-09-16
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公开(公告)号: US07243554B2公开(公告)日: 2007-07-17
- 发明人: Edward G. Wenski
- 申请人: Edward G. Wenski
- 申请人地址: US MO Kansas City
- 专利权人: Honeywell Federal Manufacturing & Technologies
- 当前专利权人: Honeywell Federal Manufacturing & Technologies
- 当前专利权人地址: US MO Kansas City
- 代理机构: Hovey Williams LLP
- 主分类号: G01L1/24
- IPC分类号: G01L1/24
摘要:
A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
公开/授权文献
- US20060010986A1 Micro-tensile testing system 公开/授权日:2006-01-19
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