发明授权
- 专利标题: Circuit board inspection device
- 专利标题(中): 电路板检测装置
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申请号: US10721461申请日: 2003-11-26
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公开(公告)号: US07250781B2公开(公告)日: 2007-07-31
- 发明人: Eigo Nakagawa , Koji Adachi , Kaoru Yasukawa , Norikazu Yamada , Koki Uwatoko , Tetsuichi Satonaga
- 申请人: Eigo Nakagawa , Koji Adachi , Kaoru Yasukawa , Norikazu Yamada , Koki Uwatoko , Tetsuichi Satonaga
- 申请人地址: JP Tokyo
- 专利权人: Fuji Xerox Co., Ltd.
- 当前专利权人: Fuji Xerox Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2002-367791 20021219; JP2002-369283 20021220; JP2003-177697 20030623
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A circuit board inspection device for inspecting the operation of a circuit board having a predetermined part or wire formed therein includes a supporting substrate disposed substantially in parallel with the parts mounting surface of the circuit board, and a signal change detection unit made of a coil or a capacitor disposed in a position of the supporting substrate corresponding to the part or wire of the circuit board, with the supporting substrate being disposed substantially in parallel with the circuit board.
公开/授权文献
- US20050017743A1 Circuit board inspection device 公开/授权日:2005-01-27
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