发明授权
- 专利标题: Device for cleaning tip and side surfaces of a probe
- 专利标题(中): 用于清洁探头末端和侧面的装置
-
申请号: US10289494申请日: 2002-11-05
-
公开(公告)号: US07254861B2公开(公告)日: 2007-08-14
- 发明人: Izuru Morioka , Satoru Sato
- 申请人: Izuru Morioka , Satoru Sato
- 申请人地址: JP Tokyo
- 专利权人: NIHON Micro Coating Co., Ltd.
- 当前专利权人: NIHON Micro Coating Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Beyer Weaver
- 优先权: JP2001-110576 20010409
- 主分类号: B24B19/00
- IPC分类号: B24B19/00 ; B24D15/04
摘要:
A device for cleaning the tip portion and the side surfaces of a probe has two or more different kinds of intermediate sheets affixed to a substrate in a side-by-side relationship with respect to each other. One of these intermediate sheets is an elastic sheet having an elastic property. Another intermediate sheet of a different kind is a plastic sheet which is less elastic. The tip portion of a probe is cleaned by a polishing layer affixed to the elastic sheet. The side surfaces of the probe are cleaned by a polishing layer affixed to the plastic sheet. A porous foamed sheet having openings on its surface and having air bubbles inside may be used as the elastic sheet. A polishing layer is formed on the surface of the foamed sheet, having a porous surface with openings corresponding to the openings on the foamed sheet. A spacer may be provided between the substrate and the plastic sheet for adjusting the heights of the polishing layers formed over the intermediate sheets.
公开/授权文献
- US20040083568A1 Device for cleaning tip and side surfaces of a probe 公开/授权日:2004-05-06
信息查询