发明授权
- 专利标题: Cell library database and timing verification and withstand voltage verification systems for integrated circuit using the same
- 专利标题(中): 电池库数据库和定时验证和耐压验证系统的集成电路使用相同
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申请号: US10630803申请日: 2003-07-31
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公开(公告)号: US07257801B2公开(公告)日: 2007-08-14
- 发明人: Shiro Sakiyama , Kouji Mochizuki
- 申请人: Shiro Sakiyama , Kouji Mochizuki
- 申请人地址: JP Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2002-240196 20020821
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
In a cell library database, timing verification is conducted on an LSI which exists in a variable power supply system capable of changing the source voltage arbitrarily and which includes logic delay information associated with a plurality of source voltages. The database is configured, for example, so that the voltage information V of the source is represented in multiple bits V [1:0] and delay times Alh (Vlh) to Bhl (Vhh) between the time input signals A and B are each changed and the time the output signal Y changes are described for respective pieces of source voltage information LH (1.2 V), HL (1.5 V) and HH (1.8 V). This allows timing verification in the variable source system which operates with the source voltage changed dynamically.
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