发明授权
- 专利标题: Polarization analyzer
- 专利标题(中): 极化分析仪
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申请号: US10537314申请日: 2003-07-14
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公开(公告)号: US07265834B2公开(公告)日: 2007-09-04
- 发明人: Shojiro Kawakami , Takashi Sato , Takayuki Kawashima , Wataru Ishikawa
- 申请人: Shojiro Kawakami , Takashi Sato , Takayuki Kawashima , Wataru Ishikawa
- 申请人地址: JP Miyagi
- 专利权人: Autocloning Technology Ltd.
- 当前专利权人: Autocloning Technology Ltd.
- 当前专利权人地址: JP Miyagi
- 代理机构: Westerman, Hattori, Daniels & Adrian, LLP.
- 优先权: JP2002-237212 20020713
- 国际申请: PCT/JP03/08888 WO 20030714
- 国际公布: WO2004/008196 WO 20040122
- 主分类号: G01J4/00
- IPC分类号: G01J4/00
摘要:
A thin polarizer array and a wavelength plate array that are composed of micro regions having different optical axis directions and wavelength characteristics and having a high extinction ratio and a low insertion loss, and a polarization analyzer using them. An array of micro periodic grooves is formed on a substrate, with the directions changed from one region to another. An alternating multilayer film formed by bias sputtering alternating a layer of high refractive index material such as Si or Ta2O5 and a layer of low refractive index material such as SiO2. By selecting a condition that each layer maintains its periodic projecting/recessed shape, an array of photonic crystal polarizer is formed. By mounting this array of photonic crystal polarizer in a photodetector array, a polarization analyzer that is small, has no movable part, has a small number of components, and enables high-precision measurement is constituted.
公开/授权文献
- US20060126066A1 Polarization analyzer 公开/授权日:2006-06-15
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