Invention Grant
- Patent Title: Apparatus for and method of analyzing transmission characteristics of a circuit apparatus
- Patent Title (中): 用于分析电路装置的传输特性的装置和方法
-
Application No.: US10939336Application Date: 2004-09-14
-
Publication No.: US07266794B2Publication Date: 2007-09-04
- Inventor: Manabu Yamazaki
- Applicant: Manabu Yamazaki
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2004-134383 20040428
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of analyzing transmission characteristics of signal wiring in a circuit apparatus including the signal wiring and insulative layer is disclosed. The transmission characteristics are analyzed by dividing the circuit apparatus with a mesh and applying electromagnetic analysis method to each unit of the mesh. The method includes the steps of: extracting signal wiring data from 3 dimensional data of the circuit apparatus; designating a sparse mesh region in which the mesh can be made sparse based on the extracted signal wiring data and the 3 dimensional data; and generating sparse mesh in the sparse mesh region. Since the sparse mesh region is designated based on the sizes of the signal wiring and the insulative layer and on the electric properties of the insulative layer, a region that affects the transmission characteristics of the signal wiring only to a small extent can be designated as the sparse mesh region.
Public/Granted literature
- US20050246669A1 Apparatus for and method of analyzing transmission characteristics of a circuit apparatus Public/Granted day:2005-11-03
Information query