发明授权
US07266794B2 Apparatus for and method of analyzing transmission characteristics of a circuit apparatus 有权
用于分析电路装置的传输特性的装置和方法

  • 专利标题: Apparatus for and method of analyzing transmission characteristics of a circuit apparatus
  • 专利标题(中): 用于分析电路装置的传输特性的装置和方法
  • 申请号: US10939336
    申请日: 2004-09-14
  • 公开(公告)号: US07266794B2
    公开(公告)日: 2007-09-04
  • 发明人: Manabu Yamazaki
  • 申请人: Manabu Yamazaki
  • 申请人地址: JP Kawasaki
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: JP Kawasaki
  • 代理机构: Staas & Halsey LLP
  • 优先权: JP2004-134383 20040428
  • 主分类号: G06F17/50
  • IPC分类号: G06F17/50
Apparatus for and method of analyzing transmission characteristics of a circuit apparatus
摘要:
A method of analyzing transmission characteristics of signal wiring in a circuit apparatus including the signal wiring and insulative layer is disclosed. The transmission characteristics are analyzed by dividing the circuit apparatus with a mesh and applying electromagnetic analysis method to each unit of the mesh. The method includes the steps of: extracting signal wiring data from 3 dimensional data of the circuit apparatus; designating a sparse mesh region in which the mesh can be made sparse based on the extracted signal wiring data and the 3 dimensional data; and generating sparse mesh in the sparse mesh region. Since the sparse mesh region is designated based on the sizes of the signal wiring and the insulative layer and on the electric properties of the insulative layer, a region that affects the transmission characteristics of the signal wiring only to a small extent can be designated as the sparse mesh region.
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