发明授权
- 专利标题: Near infrared chemical imaging microscope
- 专利标题(中): 近红外化学成像显微镜
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申请号: US11366762申请日: 2006-03-02
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公开(公告)号: US07268861B2公开(公告)日: 2007-09-11
- 发明人: Patrick J. Treado , Matthew Nelson , Scott Keitzel
- 申请人: Patrick J. Treado , Matthew Nelson , Scott Keitzel
- 申请人地址: US PA Pittsburgh
- 专利权人: ChemImage Corporation
- 当前专利权人: ChemImage Corporation
- 当前专利权人地址: US PA Pittsburgh
- 代理机构: Morgan, Lewis & Bockius LLP
- 主分类号: G01J3/28
- IPC分类号: G01J3/28
摘要:
A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted or scattered near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selecting a near infrared radiation image of the collimated beam. The filtered images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.
公开/授权文献
- US20060164640A1 Near infrared chemical imaging microscope 公开/授权日:2006-07-27
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