Invention Grant
- Patent Title: Discrete curve symmetry detection
- Patent Title (中): 离散曲线对称检测
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Application No.: US10455141Application Date: 2003-06-05
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Publication No.: US07269286B2Publication Date: 2007-09-11
- Inventor: Lothar Wenzel , Mark S. Williams
- Applicant: Lothar Wenzel , Mark S. Williams
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark S. Williams
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/64 ; G06K9/68 ; G06K9/46

Abstract:
System and method for detecting symmetries of discrete curves. A mapping operator is applied to a first discrete curve to amplify its features, generating a first mapped discrete curve. A correlation of the first mapped discrete curve with each of a plurality of rotationally shifted versions of a second mapped discrete curve is computed, generating a corresponding plurality of correlation values. A minimum period of the two curves is determined based on the correlation values, and, based on the minimum period, a symmetry group (SG) of the two curves is determined and output. If the two curves are the same curve, the SG is the rotational SG of the discrete curve. If the second curve is a reflection of the first, the SG is the mutual reflection SG of the first. If the first and second curves are different curves, the SG is the mutual SG of the two curves.
Public/Granted literature
- US20040247181A1 Discrete curve symmetry detection Public/Granted day:2004-12-09
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