发明授权
- 专利标题: Substrate supporting apparatus
- 专利标题(中): 基板支撑装置
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申请号: US10751478申请日: 2004-01-06
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公开(公告)号: US07275749B2公开(公告)日: 2007-10-02
- 发明人: Minoru Matsuzawa , Tatsuro Yoshida
- 申请人: Minoru Matsuzawa , Tatsuro Yoshida
- 申请人地址: JP Tokyo
- 专利权人: Sipec Corporation
- 当前专利权人: Sipec Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Kratz, Quintos & Hanson, LLP
- 优先权: JP2003-281206 20030728
- 主分类号: B23B31/12
- IPC分类号: B23B31/12
摘要:
A substrate supporting apparatus for supporting a substrate or wafer in a non-contact state by Bernoulli theorem is disclosed. The substrate supporting apparatus 1 comprises a housing 2, a rotatable chuck 3 which is disposed in the housing 2, which is provided at its central portion with a hollow 12 and which supports a substrate 6, and a cylindrical nozzle member 4 which is disposed in the housing 2, which has a nozzle hole 7 and which can vertically move in the hollow 12. A nozzle hole 7 is formed in a central portion of the nozzle member 4. Gas is discharged from a gas source 8 through the nozzle hole 7, thereby holding the substrate 6 by an upper surface of the chuck 3 in a non-contact state. When the substrate 6 is to be detached, the nozzle member 4 is moved upward while discharging gas from the nozzle hole 7, thereby floating the substrate 6.
公开/授权文献
- US20050023773A1 Substrate supporting apparatus 公开/授权日:2005-02-03
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