发明授权
- 专利标题: Integral topside vacuum package
- 专利标题(中): 整体顶层真空包装
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申请号: US10750580申请日: 2003-12-29
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公开(公告)号: US07276798B2公开(公告)日: 2007-10-02
- 发明人: Robert E. Higashi , Karen M. Newstrom-Peitso , Jeffrey A. Ridley
- 申请人: Robert E. Higashi , Karen M. Newstrom-Peitso , Jeffrey A. Ridley
- 申请人地址: US NJ Morristown
- 专利权人: Honeywell International Inc.
- 当前专利权人: Honeywell International Inc.
- 当前专利权人地址: US NJ Morristown
- 代理商 Kris T. Fredrick
- 主分类号: H01L31/0236
- IPC分类号: H01L31/0236
摘要:
An integrated vacuum package having an added volume on a perimeter within the perimeter of a bonding seal between two wafers. The added volume of space may be an etching of material from the inside surface of the top wafer. This wafer may have vent holes that may be sealed to maintain a vacuum within the volume between the two wafers after the pump out of gas and air. The inside surface of the top wafer may have an anti-reflective pattern. Also, an anti-reflective pattern may be on the outside surface of the top wafer. The seal between the two wafers may be ring-like and have a spacer material. Also, it may have a malleable material such as solder to compensate for any flatness variation between the two facing surfaces of the wafers.
公开/授权文献
- US20040140570A1 Integral topside vacuum package 公开/授权日:2004-07-22
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