发明授权
- 专利标题: Gas-admission element for CVD processes, and device
- 专利标题(中): 用于CVD工艺的气体检测元件和装置
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申请号: US10395948申请日: 2003-03-24
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公开(公告)号: US07294207B2公开(公告)日: 2007-11-13
- 发明人: Gerd Strauch , Johannes Kaeppeler , Martin Dauelsberg
- 申请人: Gerd Strauch , Johannes Kaeppeler , Martin Dauelsberg
- 申请人地址: DE
- 专利权人: Aixtron AG
- 当前专利权人: Aixtron AG
- 当前专利权人地址: DE
- 代理机构: St. Onge Steward Johnston & Reens LLC
- 优先权: DE10061671 20000922; DE10064941 20001223
- 主分类号: C23C16/455
- IPC分类号: C23C16/455 ; H01L21/306 ; C23F1/00 ; C23C16/06 ; C23C16/18
摘要:
The invention relates to a method for depositing especially, crystalline layers onto especially, crystalline substrates. At least two process gases are led into a process chamber of a reactor separately from each other, through a gas inlet mechanism above a heated susceptor. The first process gas flows through a central line with a central outlet opening and the second process gas flows through a line which is peripheral thereto and which has a peripheral outlet opening that is formed by a gas-permeable gas outlet ring. Said gas outlet ring surrounds a ring-shaped pre-chamber. The invention provides that in order to avoid a parasitic deposition in the area of the peripheral outlet opening, the end section of the gas outlet ring that faces towards the susceptor or the radially outer section of the surface of the gas outlet mechanism surrounding the central outlet opening is cooled by the second process gas according to a truncated cone or revolution hyperboloid shape of a gas guiding surface formed by the pre-chamber back wall.
公开/授权文献
- US20030177977A1 Gas-admission element for CVD processes, and device 公开/授权日:2003-09-25
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