发明授权
- 专利标题: Eye optical characteristic measuring instrument
- 专利标题(中): 眼睛光学特性测量仪器
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申请号: US10488790申请日: 2002-08-09
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公开(公告)号: US07311402B2公开(公告)日: 2007-12-25
- 发明人: Toshifumi Mihashi , Yoko Hirohara , Takashi Fujikado , Naoyuki Maeda
- 申请人: Toshifumi Mihashi , Yoko Hirohara , Takashi Fujikado , Naoyuki Maeda
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Topcon
- 当前专利权人: Kabushiki Kaisha Topcon
- 当前专利权人地址: JP Tokyo
- 代理机构: Foley & Lardner LLP
- 优先权: JP2001-271679 20010907
- 国际申请: PCT/JP02/08197 WO 20020809
- 国际公布: WO03/022138 WO 20030320
- 主分类号: A61B3/10
- IPC分类号: A61B3/10
摘要:
Scattering can be measured by using an optical system having a Hartman-Shack wave-surface sensor. An eye optical characteristic measuring instrument comprises a light source unit 10 for emitting a light beam of a wavelength in the near-infrared region, an illumination optical system 40 for illuminating a small area of the retinal of an eye to be measured with the light beam from the light source unit 10, a light-receiving optical system 20 for receiving a part of the reflected beam of the light beam from the light source unit 10 reflected from the retina through a converting member for converting the part of the reflected light beam into at least substantially 17 light beams, a light-receiving section 23 for receiving the received light beam directed by the light-receiving optical system 20 and generating a signal, and a calculating unit for determining the wavefront aberration of the light beam entering the light-receiving optical system 20 and the degree of scattering of the received light beam on the basis of the signal from the light-receiving section 23.
公开/授权文献
- US20050073647A1 Eye optical characteristic measuring instrument 公开/授权日:2005-04-07