发明授权
- 专利标题: Mass spectrometer and mass analysis method
- 专利标题(中): 质谱仪和质量分析方法
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申请号: US11325444申请日: 2006-01-05
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公开(公告)号: US07319222B2公开(公告)日: 2008-01-15
- 发明人: Yuichiro Hashimoto , Hideki Hasegawa , Izumi Waki
- 申请人: Yuichiro Hashimoto , Hideki Hasegawa , Izumi Waki
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Reed Smith LLP
- 代理商 Stanley P. Fisher, Esq.; Juan Carlos A. Marquez, Esq.
- 优先权: JP2005-078367 20050318; JP2005-222327 20050801
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
A linear trap which allows for charge separation and ion mobility separation in a speedy manner, and enables measurement with high duty cycle. A mass spectrometer comprises an ion source, an ion trap for trapping ions ionized by the ion source, an ion trap controller for controlling a voltage on an electrode included in the ion trap, and a detector for detecting the ions ejected from the ion trap. The ion trap controller includes a table for each mass-to-charge ratio, the table containing a frequency of the voltage used for charge separation, and a gain of the voltage for ejecting a first ion with a first charge outside the ion trap, and retaining in the ion trap a second group of ions with a second charge that is lower than that of the first charge. The ion trap controller controls the voltage based on the mass-to-charge ratio set. The mass spectrometer has significantly improved sensitivity, as compared to the prior art.
公开/授权文献
- US20060219896A1 Mass spectrometer and mass analysis method 公开/授权日:2006-10-05