Invention Grant
- Patent Title: Self-referencing instrument and method thereof for measuring electromagnetic properties
- Patent Title (中): 用于测量电磁特性的自参考仪器及其方法
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Application No.: US11197195Application Date: 2005-08-04
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Publication No.: US07321424B2Publication Date: 2008-01-22
- Inventor: James A. McCandless
- Applicant: James A. McCandless
- Applicant Address: US MA Acton
- Assignee: Acton Research Corp.
- Current Assignee: Acton Research Corp.
- Current Assignee Address: US MA Acton
- Agency: St. Onge Steward Johnston & Reens LLC
- Main IPC: G01J3/42
- IPC: G01J3/42

Abstract:
In a self-referencing instrument for measuring electromagnetic radiation, a mounting member to which a sample can be coupled moves the sample such that, in a first position, the electromagnetic radiation impinges on the sample, and, in a second position, the electromagnetic radiation does not impinge on the sample. A detection unit receives the electromagnetic radiation from the sample and generates a sample signal when the sample is in the first position, and the detection unit receives the electromagnetic radiation from the source and generates a reference signal when the sample is in the second position. A processor coupled to the detection unit processes the reference signal and the sample signal. This results in a continuous, accurate reference measurement, and permits the instrument to efficiently compensate for error, while offering accurate measurements.
Public/Granted literature
- US20060055932A1 Self-referencing instrument and method thereof for measuring electromagnetic properties Public/Granted day:2006-03-16
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