发明授权
- 专利标题: Quality control apparatus and control method of the same, and recording medium recorded with quality control program
- 专利标题(中): 质量控制装置和控制方法相同,记录介质记录有质量控制程序
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申请号: US11116457申请日: 2005-04-28
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公开(公告)号: US07324862B2公开(公告)日: 2008-01-29
- 发明人: Shiro Sugihara , Toru Fujii , Mineo Sono
- 申请人: Shiro Sugihara , Toru Fujii , Mineo Sono
- 申请人地址: JP Kyoto-Shi
- 专利权人: Omron Corporation
- 当前专利权人: Omron Corporation
- 当前专利权人地址: JP Kyoto-Shi
- 代理机构: Foley & Lardner LLP
- 优先权: JP2004-136409 20040430; JP2004-306159 20041020
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a data storing part which collects measurement data measured by multiple devices disposed in a manufacturing process and stores the collected measurement data along with measured time or collected time; and a scheduler which associates the measurement data of the devices with each other in consideration of dead time generated between the devices at measured time or collected time.
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