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US07324913B2 Methods and apparatus for testing a link between chips 失效
测试芯片之间链路的方法和装置

Methods and apparatus for testing a link between chips
摘要:
In a first aspect, a first method of testing a link between a first chip and a second chip is provided. The first method includes the steps of, while operating in a test mode, (1) transmitting test data of sufficient length to enable exercising of worst case transitions from the first chip to the second chip via the link; and (2) performing cyclic redundancy checking (CRC) on the test data to test the link. Numerous other aspects are provided.
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