发明授权
US07325304B2 Method of connecting probe pin to circuit board and method of manufacturing probe card
有权
将探针连接到电路板的方法和制造探针卡的方法
- 专利标题： Method of connecting probe pin to circuit board and method of manufacturing probe card
- 专利标题（中）： 将探针连接到电路板的方法和制造探针卡的方法
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申请号： US11142806申请日： 2005-06-01
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公开(公告)号： US07325304B2公开(公告)日： 2008-02-05
- 发明人: Wataru Narazaki , Tadao Saito
- 申请人： Wataru Narazaki , Tadao Saito
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Osha Liang LLP
- 优先权： JP2002-351763 20021203
- 主分类号： H01R43/20
- IPC分类号： H01R43/20
摘要：
There is provided a method of manufacturing a probe card that electrically connects a testing device and a device under test to transmit a signal between the testing device and the device under test. The method includes the steps of forming a probe pin on a probe pin substrate, joining the probe pin held on the probe pin substrate to a circuit board, and cutting the probe pin to separate the probe pin substrate from the probe pin.
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