发明授权
- 专利标题: Method for optically trimming electronic components
- 专利标题(中): 光学修整电子部件的方法
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申请号: US10846210申请日: 2004-05-14
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公开(公告)号: US07332402B2公开(公告)日: 2008-02-19
- 发明人: William Freeman
- 申请人: William Freeman
- 申请人地址: US CA Sunnyvale
- 专利权人: Finisar Corporation
- 当前专利权人: Finisar Corporation
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Workman Nydegger
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; H01L21/00
摘要:
Methods for adjusting the bulk material properties of manufactured components, such as resistors, thermistors, varistors, capacitors, resonators, oscillators, and optical components. Adjustment of the resistance of a resistor can be achieved by directing a high energy beam, such as an ultraviolet beam, onto a resistor formed from a matrix component and an embedded conductive component. The high energy beam adjusts the resistivity of the resistor material substantially without ablating the matrix component by affecting the matrix component, the conductive component, or both. Because of the lack of ablation, the material having a property to be adjusted can be a sub-layer in a laminated structure, with the high energy beam being directed through other layers formed thereon.
公开/授权文献
- US20040214452A1 Method for optically trimming electronic components 公开/授权日:2004-10-28
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