发明授权
US07335455B2 Method of forming an underlayer of a bi-layer resist film and method of fabricating a semiconductor device using the same 有权
形成双层抗蚀剂膜的底层的方法和使用其制造半导体器件的方法

Method of forming an underlayer of a bi-layer resist film and method of fabricating a semiconductor device using the same
摘要:
A method of forming an underlayer of a bi-layer resist including forming a blended material by blending a polymer having an aromatic group and a methacrylate polymer, and coating a substrate with the blended material. The blended material coated on the substrate is irradiated to form an underlayer. The polymer having the aromatic group may be a novolac polymer or a naphthalene polymer.
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