发明授权
- 专利标题: Method of forming an underlayer of a bi-layer resist film and method of fabricating a semiconductor device using the same
- 专利标题(中): 形成双层抗蚀剂膜的底层的方法和使用其制造半导体器件的方法
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申请号: US10787368申请日: 2004-02-26
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公开(公告)号: US07335455B2公开(公告)日: 2008-02-26
- 发明人: Hyun-Woo Kim , Jin Hong , Myoung-Ho Jung , Sang-Gyun Woo
- 申请人: Hyun-Woo Kim , Jin Hong , Myoung-Ho Jung , Sang-Gyun Woo
- 申请人地址: KR Gyeonggi-Do
- 专利权人: Samsung Electronics Co. Ltd
- 当前专利权人: Samsung Electronics Co. Ltd
- 当前专利权人地址: KR Gyeonggi-Do
- 代理机构: F. Chau & Associates, LLC.
- 优先权: KR10-2003-0040773 20030623
- 主分类号: G03F7/00
- IPC分类号: G03F7/00 ; G03F7/004
摘要:
A method of forming an underlayer of a bi-layer resist including forming a blended material by blending a polymer having an aromatic group and a methacrylate polymer, and coating a substrate with the blended material. The blended material coated on the substrate is irradiated to form an underlayer. The polymer having the aromatic group may be a novolac polymer or a naphthalene polymer.
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