发明授权
US07335541B2 Method for fabricating thin film transistor using the mask for forming polysilicon including slit patterns deviated from each other 有权
使用该掩模制造薄膜晶体管的方法,用于形成包括彼此偏离的狭缝图案的多晶硅

Method for fabricating thin film transistor using the mask for forming polysilicon including slit patterns deviated from each other
摘要:
A mask for crystallization of amorphous silicon to polysilicon is provided. The mask includes a plurality of slit patterns for defining regions to be illuminated. The plurality of slit patterns are formed along a longitudinal first direction and the mask moves along a longitudinal second direction. The first longitudinal direction is substantially perpendicular to the second longitudinal direction. Each of the split patterns is deviated apart by substantially a same distance from another. Thus, the polysilicon using the mask are grown to be isotropic with respect to the horizontal and vertical directions.
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