Invention Grant
- Patent Title: Analog amplitude detector
- Patent Title (中): 模拟幅度检测器
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Application No.: US11338068Application Date: 2006-01-24
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Publication No.: US07336129B2Publication Date: 2008-02-26
- Inventor: Meng-An Pan
- Applicant: Meng-An Pan
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Main IPC: H03F3/45
- IPC: H03F3/45

Abstract:
A circuit includes at least two transistors arranged to form a current mirror, at least two transistors operatively coupled to the current mirror, where the transistors are arranged to form a differential pair amplifier, and a follower transistor operatively coupled to the current mirror and to the differential pair. The transistors of the differential pair, the current mirror, and the follower transistor are operatively coupled such that during operation an amplitude of a signal output from the follower transistor is proportional to an amplitude of an signal input into the differential pair.
Public/Granted literature
- US20070170989A1 Analog amplitude detector Public/Granted day:2007-07-26
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