Invention Grant
- Patent Title: Event-based automated diagnosis of known problems
- Patent Title (中): 基于事件的自动诊断已知问题
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Application No.: US11556638Application Date: 2006-11-03
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Publication No.: US07337092B2Publication Date: 2008-02-26
- Inventor: Chun Yuan , Ji-Rong Wen , Wei-Ying Ma , Yi-Min Wang , Zheng Zhang
- Applicant: Chun Yuan , Ji-Rong Wen , Wei-Ying Ma , Yi-Min Wang , Zheng Zhang
- Applicant Address: US WA Redmond
- Assignee: Microsoft Corporation
- Current Assignee: Microsoft Corporation
- Current Assignee Address: US WA Redmond
- Agency: Lee & Hayes, PLLC
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
System events preceding occurrence of a problem are likely to be similar to events preceding occurrence of the same problem at other times or on other systems. Thus, the cause of a problem may be identified by comparing a trace of events preceding occurrence of the problem with previously diagnosed traces. Traces of events preceding occurrences of a problem arising from a known cause are reduced to a series of descriptive elements. These elements are aligned to correlate differently timed but otherwise similar traces of events, converted into symbolic representations, and archived. A trace of events leading to an undiagnosed a problem similarly is converted to a symbolic representation. The representation of the undiagnosed trace is then compared to the archived representations to identify a similar archived representation. The cause of the similar archived representation is presented as a diagnosis of the problem.
Public/Granted literature
- US20070061623A1 Event-Based Automated Diagnosis of Known Problems Public/Granted day:2007-03-15
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