Invention Grant
- Patent Title: Slurry delivery system, chemical mechanical polishing apparatus and method for using the same
- Patent Title (中): 浆料输送系统,化学机械抛光装置及其使用方法
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Application No.: US11434215Application Date: 2006-05-16
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Publication No.: US07338352B2Publication Date: 2008-03-04
- Inventor: Choong-Kee Seong , Chang-Ki Hong , Jae-Dong Lee
- Applicant: Choong-Kee Seong , Chang-Ki Hong , Jae-Dong Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2005-0041598 20050518
- Main IPC: B24B1/00
- IPC: B24B1/00

Abstract:
A slurry delivery system, a chemical mechanical polishing (CMP) apparatus, and method for using the same are provided. An apparatus for supplying slurry to a polishing unit may include a first feed line through which an abrasive may be supplied at a first velocity. A velocity-changing member may be connected to the first feed line, and/or a velocity of the abrasive may be changed from the first velocity to. the second velocity different from the first velocity by the velocity-changing member. A second feed line may be connected to the velocity-changing member and/or an additive may be supplied through the second feed line. A supply line may be connected to the velocity-changing member. A slurry, which may be a mixture of the abrasive and/or the additive, may be supplied to a polishing unit through the supply line. Accordingly, the slurry may be more uniformly mixed and/or supplied to a polishing unit.
Public/Granted literature
- US20060262641A1 Slurry delivery system, chemical mechanical polishing apparatus and method for using the same Public/Granted day:2006-11-23
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