发明授权
US07348913B2 Arbitrary waveform generator, arbitrary waveform generate method, testing apparatus, and program 有权
任意波形发生器,任意波形生成方法,测试仪器和程序

  • 专利标题: Arbitrary waveform generator, arbitrary waveform generate method, testing apparatus, and program
  • 专利标题(中): 任意波形发生器,任意波形生成方法,测试仪器和程序
  • 申请号: US11443684
    申请日: 2006-05-31
  • 公开(公告)号: US07348913B2
    公开(公告)日: 2008-03-25
  • 发明人: Masayuki Kawabata
  • 申请人: Masayuki Kawabata
  • 申请人地址: JP Tokyo
  • 专利权人: Advantest Corporation
  • 当前专利权人: Advantest Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Osha·Liang LLP
  • 优先权: JP2005-161212 20050601
  • 主分类号: H03M1/76
  • IPC分类号: H03M1/76
Arbitrary waveform generator, arbitrary waveform generate method, testing apparatus, and program
摘要:
There is provided an arbitrary waveform generator that generates an arbitrary waveform. The arbitrary waveform generator includes a waveform pattern generating section that generates pattern data showing a pattern of the arbitrary waveform, a digital-analog converting section that outputs the arbitrary waveform based on the pattern data, and a correction processing section that corrects the pattern data and inputs the corrected data into the digital-analog converting section based on a value made by differentiating the pattern data and a time constant of a path through which the arbitrary waveform output from the digital-analog converting section passes.
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