发明授权
- 专利标题: Reference leak
- 专利标题(中): 参考泄漏
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申请号: US11228821申请日: 2005-09-16
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公开(公告)号: US07353687B2公开(公告)日: 2008-04-08
- 发明人: Jie Tang , Liang Liu , Peng Liu , Zhao-Fu Hu , Bing-Chu Du , Cai-Lin Guo , Pi-Jin Chen , Shou-Shan Fan
- 申请人: Jie Tang , Liang Liu , Peng Liu , Zhao-Fu Hu , Bing-Chu Du , Cai-Lin Guo , Pi-Jin Chen , Shou-Shan Fan
- 申请人地址: CN Beijing TW Tu-Cheng, Taipei Hsien
- 专利权人: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: CN Beijing TW Tu-Cheng, Taipei Hsien
- 代理商 Jeffrey T. Knapp
- 优先权: CN200510032731 20050106
- 主分类号: G01F25/00
- IPC分类号: G01F25/00
摘要:
A reference leak includes a leak layer formed of one of a metallic material, a glass material, and a ceramic material. The metallic material is selected from the group consisting of copper, nickel, and molybdenum. The leak layer comprises a number of substantially parallel leak through holes defined therein. The leak through holes may be cylindrical holes or polyhedrical holes. A length of each of the leak through holes is preferably not less than 20 times a diameter thereof. A diameter of each of the leak through holes is generally in the range from 10 nm to 500 nm. A length of each of the leak through holes is generally in the range from 100 nm to 100 μm. A leak rate of the reference leak is in the range from 10−8 to 10−15 tor×l/s. The leak through holes have substantially same length and diameter.
公开/授权文献
- US20060144120A1 Reference leak 公开/授权日:2006-07-06
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