发明授权
- 专利标题: Adapter for circuit board examination and device for circuit board examination
- 专利标题(中): 电路板检查用适配器和电路板检查装置
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申请号: US10588760申请日: 2005-02-17
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公开(公告)号: US07362087B2公开(公告)日: 2008-04-22
- 发明人: Kiyoshi Kimura , Sugiro Shimoda
- 申请人: Kiyoshi Kimura , Sugiro Shimoda
- 申请人地址: JP Tokyo
- 专利权人: JSR Corporation
- 当前专利权人: JSR Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2004-048158 20040224
- 国际申请: PCT/JP2005/002441 WO 20050217
- 国际公布: WO2005/080996 WO 20050901
- 主分类号: G01R31/02
- IPC分类号: G01R31/02 ; H01R11/01 ; H01R4/58
摘要:
An adaptor for inspection of circuit boards includes a wiring board for connection, on a front surface of which a plurality of connecting electrodes are formed correspondingly to electrodes to be inspected, and an anisotropically conductive elastomer sheet detachably arranged on the front surface of the wiring board for connection. The anisotropically conductive elastomer sheet has a surface roughness of 0.5 to 5 μm on its front surface coming into contact with the circuit board, and a surface roughness of at most 0.3 μm on its back surface coming into contact with the wiring board for connection. The wiring board for connection has, on its front surface, an insulating layer formed such that each of the connecting electrodes is exposed, and the insulating layer has a surface roughness of at most 0.2 μm on its front surface.
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