发明授权
- 专利标题: Method and apparatus for high-speed input sampling
- 专利标题(中): 高速输入采样方法和装置
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申请号: US10918008申请日: 2004-08-12
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公开(公告)号: US07366942B2公开(公告)日: 2008-04-29
- 发明人: Seonghoon Lee
- 申请人: Seonghoon Lee
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: TraskBritt
- 主分类号: G06F1/04
- IPC分类号: G06F1/04
摘要:
A signal sampler and method for high-speed input sampling of a signal are disclosed. A first sampler samples a data signal at a rising edge of a clock signal and generates a first sampled signal. A second sampler samples the data signal at a falling edge of an inverted clock signal and generates a second sampled signal. The first and second sampled signals may be combined to determine the next signal sampler output. An evaluation may include asserting the output signal if the first and second sampled signals are asserted, negating the output signal if the first and second sampled signal are negated, and toggling the output signal if the first and second sampled signals are in opposite logic states. The signal sampler and method of signal sampling may be incorporated in a semiconductor device, which may be fabricated on a semiconductor wafer and included in an electronic system.
公开/授权文献
- US20060034405A1 Method and apparatus for high-speed input sampling 公开/授权日:2006-02-16
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