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US07370237B2 Semiconductor memory device capable of accessing all memory cells 失效
能够访问所有存储单元的半导体存储器件

Semiconductor memory device capable of accessing all memory cells
Abstract:
A semiconductor memory device according to embodiments of the invention includes N channels for interface with an outside. During a test mode where the semiconductor memory device is tested by a tester having M channels, K ones of the N channels of the memory device are connected to the M channels of the tester, N being more than M and M being equal to or more than R*K (where R is an integer).
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