Invention Grant
- Patent Title: Method and apparatus for determining insulation thickness
- Patent Title (中): 确定绝缘厚度的方法和装置
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Application No.: US11177544Application Date: 2005-07-08
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Publication No.: US07370538B2Publication Date: 2008-05-13
- Inventor: Michael D. Suda , Jeffrey R. Sacks
- Applicant: Michael D. Suda , Jeffrey R. Sacks
- Applicant Address: US PA Valley Forge
- Assignee: CertainTeed Corporation
- Current Assignee: CertainTeed Corporation
- Current Assignee Address: US PA Valley Forge
- Agency: Duane Morris LLP
- Agent Steven E. Koffs
- Main IPC: G01N3/08
- IPC: G01N3/08

Abstract:
A method for determining the thickness of a layer of insulation comprises the steps of: contacting a top surface of a portion of the layer of insulation, compressing the portion of the layer of insulation until a predetermined compressive load is achieved, measuring a distance through which the top surface is moved during the compressing step, and determining the thickness of the layer of insulation based on the measured distance. Apparatus is provided for performing the method.
Public/Granted literature
- US20070006664A1 Method and apparatus for determining insulation thickness Public/Granted day:2007-01-11
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