Invention Grant
US07372944B2 X-ray diagnostics device and method for controlling an X-ray diagnostics device
失效
用于控制X射线诊断装置的X射线诊断装置和方法
- Patent Title: X-ray diagnostics device and method for controlling an X-ray diagnostics device
- Patent Title (中): 用于控制X射线诊断装置的X射线诊断装置和方法
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Application No.: US11352716Application Date: 2006-02-13
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Publication No.: US07372944B2Publication Date: 2008-05-13
- Inventor: Philipp Bernhardt , Martin Hoheisel
- Applicant: Philipp Bernhardt , Martin Hoheisel
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Priority: DE102005006895 20050215
- Main IPC: H05G1/22
- IPC: H05G1/22

Abstract:
The invention relates to an x-ray diagnostics device having an x-ray tube for generating x-rays operated by a high voltage generator, having an x-ray detector for converting incident x-rays into electrical signals, having an image processing system and a control device for the duration of the x-ray pulse, in which parameters of the x-ray diagnostics device can be adjusted, with a computing unit being assigned to the control device, said computing unit determining the spatial frequency-dependent signal-to-noise ratio on the basis of the parameters and calculating therefrom the duration of the x-ray pulse and/or the remaining parameters required for a recording. The invention further relates to a method of this type for controlling the x-ray diagnostics device, in which the duration of the x-ray pulse is controlled such that the recognizability of relevant, moved objects is maximal.
Public/Granted literature
- US20060182221A1 X-ray diagnostics device and method for controlling an X-ray diagnostics device Public/Granted day:2006-08-17
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