发明授权
- 专利标题： Retro-reflective target wafer for a position determination system
- 专利标题（中）： 用于位置确定系统的反射反射目标晶片
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申请号： US11588329申请日： 2006-10-27
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公开(公告)号： US07373726B2公开(公告)日： 2008-05-20
- 发明人: David A. Jackson , Rodney Harrell
- 申请人： David A. Jackson , Rodney Harrell
- 申请人地址： US IL Lincolnshire
- 专利权人： Snap-On Technologies, Inc.
- 当前专利权人： Snap-On Technologies, Inc.
- 当前专利权人地址： US IL Lincolnshire
- 代理机构： McDermott Will & Emery LLP
- 主分类号： G01B11/275
- IPC分类号： G01B11/275
摘要：
A target that is usable in a position determination system such as, for example, a wheel alignment system, is structurally stable over wide temperature ranges, protected from humidity and chemical contamination, and not subject to breakage. A layered target structure includes a substrate board, a retro-reflective layer formed on the substrate board, a transparent sheet overlaying the retro-reflective layer, and an opaque patterned layer between the a retro-reflective layer and the transparent sheet. The layered target structure may be secured a support assembly.