发明授权
- 专利标题: Method and device for measuring quantity of wear
- 专利标题(中): 测量磨损量的方法和装置
-
申请号: US11267577申请日: 2005-11-07
-
公开(公告)号: US07375327B2公开(公告)日: 2008-05-20
- 发明人: Masahiko Yoshiki , Makoto Kato
- 申请人: Masahiko Yoshiki , Makoto Kato
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2002-111785 20020415
- 主分类号: G21K7/00
- IPC分类号: G21K7/00 ; G01N23/227 ; G01N23/00
摘要:
A method and device to accurately obtain very small quantity of wear of the order of nanometers of a protective film on the surface of a sliding member. A quantity of wear on the surface of a measurement sample including a base and a coating layer is measured by making a spectrum of the surface elements in a reference sample using a surface-element analysis device which analyzes elements on the surface of a substance from an energy spectrum of charged particles obtained by applying excited ionization radiation on the reference sample equivalent to the measurement and by measuring charged particles generated from the surface of the substance. A step of obtaining signal intensity ratios of plural elements from the spectrum is repeated a plurality of times while the surface of the reference sample is being etched and calibration curves which indicate a distribution of the signal intensity ratios of the plural elements in the reference sample are made. Subsequently, an energy spectrum of charged particles from the surface of the measurement sample is measured, signal intensity ratios of specific elements are calculated and compared with the calibration curves to determine a quantity of wear of the measurement sample.
公开/授权文献
- US20060108545A1 Method and device for measuring quantity of wear 公开/授权日:2006-05-25
信息查询