发明授权
- 专利标题： Potential measuring apparatus
- 专利标题（中）： 潜在测量仪器
-
申请号： US11434780申请日： 2006-05-17
-
公开(公告)号： US07382137B2公开(公告)日： 2008-06-03
- 发明人: Takashi Ushijima , Yoshikatsu Ichimura , Atsushi Kandori , Yoshitaka Zaitsu
- 申请人： Takashi Ushijima , Yoshikatsu Ichimura , Atsushi Kandori , Yoshitaka Zaitsu
- 申请人地址： JP Tokyo
- 专利权人： Canon Kabushiki Kaisha
- 当前专利权人： Canon Kabushiki Kaisha
- 当前专利权人地址： JP Tokyo
- 代理机构： Fitzpatrick, Cella, Harper & Scinto
- 优先权： JP2005-156461 20050527
- 主分类号： G01R29/12
- IPC分类号： G01R29/12
摘要：
A potential measuring apparatus has a detection electrode on which an electric charge is induced according to a potential of a detection object, and a modulator for altering the generated quantity of the electric charge. The detection electrode has at least one depressed portion on a surface opposite to the detection object.
公开/授权文献
- US20060267578A1 Potential measuring apparatus 公开/授权日：2006-11-30
信息查询
