Invention Grant
- Patent Title: Spectroscopic sensor for measuring sheet properties
- Patent Title (中): 用于测量片材性能的光谱传感器
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Application No.: US11636810Application Date: 2006-12-11
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Publication No.: US07382456B2Publication Date: 2008-06-03
- Inventor: Sebastien Tixier , Daniel A. Gordon , Frank M. Haran
- Applicant: Sebastien Tixier , Daniel A. Gordon , Frank M. Haran
- Applicant Address: CA Ontario
- Assignee: Honeywell ASCA, Inc.
- Current Assignee: Honeywell ASCA, Inc.
- Current Assignee Address: CA Ontario
- Agency: Scully, Scott, Murphy & Presser PC
- Main IPC: G01J3/51
- IPC: G01J3/51 ; G01B11/06

Abstract:
A spectroscopic sensor for measuring flat sheet product is disclosed. The disclosed sensor uses a combination of spectrometers and single-channel detectors and filters together with a broadband source of illumination to optimally measure multiple properties of a flat sheet product. A spectrometer is used to measure over a spectral range where an easily configurable set of wavelength channels is needed and where the signal-to-noise ratios and spectral resolutions of the channels are consistent with the spectral range and number of pixels of the spectrometer; while one or more single channel detector and filter combinations are used to measure, with high signal-to-noise ratio, at specific wavelengths within or outside the spectral range of the spectrometer(s). Therefore, the single channel detectors can be used to complement the information provided by a spectrometer or to extend the working range of a spectrometer by providing single wavelength measurements anywhere in the visible, near-IR or mid-IR spectral regions.
Public/Granted literature
- US20070153281A1 Spectroscopic sensor for measuring sheet properties Public/Granted day:2007-07-05
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