Invention Grant
- Patent Title: Standard plane sample and optical characteristic measurement system
- Patent Title (中): 标准平面采样和光学特性测量系统
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Application No.: US11287329Application Date: 2005-11-23
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Publication No.: US07385701B2Publication Date: 2008-06-10
- Inventor: Koji Watanabe , Norio Ishikawa , Masao Nakamuro
- Applicant: Koji Watanabe , Norio Ishikawa , Masao Nakamuro
- Applicant Address: JP Sakai-Shi
- Assignee: Konica Minolta Sensing, Inc.
- Current Assignee: Konica Minolta Sensing, Inc.
- Current Assignee Address: JP Sakai-Shi
- Agency: Sidley Austin LLP
- Priority: JP2004-340763 20041125
- Main IPC: G01J3/46
- IPC: G01J3/46
Abstract:
A standard plane sample which supplies an optical characteristic measuring device with reference data. The standard plane sample including a sample portion that is measured by the optical characteristic measuring device to supply measurement data, and a recording medium that stores identification data for identifying a kind of the sample portion as well as reference data corresponding to the optical characteristic of the sample portion.
Public/Granted literature
- US20060109458A1 Standard plane sample and optical characteristic measurement system Public/Granted day:2006-05-25
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