Invention Grant
- Patent Title: Time-of-flight spectrometer with orthogonal pulsed ion detection
- Patent Title (中): 具有正交脉冲离子检测的飞行时间谱仪
-
Application No.: US11157907Application Date: 2005-06-22
-
Publication No.: US07388193B2Publication Date: 2008-06-17
- Inventor: Gangqiang Li
- Applicant: Gangqiang Li
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01J49/40
- IPC: H01J49/40
Abstract:
This invention provides an apparatus and method for efficient detection of ions in a time-of-flight mass spectrometer. The apparatus of the invention provides for orthogonal deflection of ions in the flight tube of a time of flight mass spectrometer to a detector or detectors positioned along or in the wall of the flight tube of the mass spectrometer. A method of detecting ions utilizing the apparatus is also provided.
Public/Granted literature
- US20070023636A1 Time-of-flight spectrometer with orthogonal pulsed ion detection Public/Granted day:2007-02-01
Information query
