Invention Grant
- Patent Title: Image processing apparatus and refractive index distribution measuring apparatus
- Patent Title (中): 图像处理装置和折射率分布测定装置
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Application No.: US11335393Application Date: 2006-01-18
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Publication No.: US07388676B2Publication Date: 2008-06-17
- Inventor: Yasuhiro Sawada
- Applicant: Yasuhiro Sawada
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Morgan & Finnegan LLP
- Priority: JP2005-012174 20050119
- Main IPC: G01N21/41
- IPC: G01N21/41

Abstract:
An image processing apparatus is disclosed which can produce refractive index distribution data with high accuracy without limiting directions in which transmitted wavefronts are measured. The image processing apparatus has a simulating section which simulates a transmitted wavefront in each of the directions to produce a second transmitted wavefront image based on first refractive index distribution data, a comparing section which produces first information indicating the result of comparison between the second transmitted wavefront image and the first transmitted wavefront image, and a changing section which changes the first refractive index distribution data based on the first information to produce second refractive index distribution data. In the apparatus, the processing in the sections is repeated using the second refractive index distribution data as the first refractive index distribution data to produce the resulting second refractive index distribution data which is used as the output refractive index distribution data.
Public/Granted literature
- US20060159332A1 Image processing apparatus and refractive index distribution measuring apparatus Public/Granted day:2006-07-20
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